Diseño del Control de Temperatura para Pruebas de BURN-IN de Decodificadores de TV

Abstract

This project focuses in the developing a practical and economical solution for a stress testing room the temperature most be constant and where the equipment tested should not be exposed to high temperatures, nor extended periods of time which are given by the factory. This process is known as BURN-IN, a process where the devices are put to a test of extreme temperatures for a short period of time, to make sure the integrated circuits are not failing neither the soldering points. For this purpose it is designed a temperature control using the sensor chip LM35 and implementing the communication through the serial protocol RS485 between PICs 16F873A and the software LabVIEW to process the information and control the system.