CARACTERIZACIÓN METALOGRÁFICA Y MEDICIONES DE MICRODUREZA EN UNA MUESTRA DE TÁNTALO RECICLADO AL 99.9% DE PUREZA

Abstract

In this project, the microhardness was measured and the micrographs of a series of tantalum samples at 99.9% purity were observed. These samples were recycled from a tantalum disc and thermally treated in a normalizing process. 4 probes were prepared, the first treated at 800 °C, the second at 1000 °C and the third at 1150 °C, the fourth was not thermally treated. After treatment, they were sanded and polished respectively to chemically attack. Once attacked, the micrographs and microhardness values ​​were obtained for each of the samples. According to the results obtained, an increase in microhardness values ​​is evident towards the areas close to the interface between the material and Bakelite. On the other hand, in the central area of ​​the sample treated at 1150 °C, a decrease in microhardness values ​​is evident. The variation in microhardness values ​​is possibly related to the concentration of oxygen present in the material (Stecura, 1973; Marinelli, 2019).