Tópicos de óptica física y su implementación en la elipsometría

Abstract

The majority of bibliographic material around ellipsometry are articles, postgraduate theses and texts, this documents are written using a formal and specialized language on the subject. Therefore, an undergraduate student who wishes to initiate a study and / or work on this topic, will find the need to consult various sources of reference, as well as understand and articulate them in pro of their academic process. In this context, arises the initiative in elaborate the present document, which is written and structured in order to be a autocontained reference material, which allows a first approach of undergraduate students around ellipsometry. Given this, this document addresses the main topics of classical electromagnetic theory, solid state physics, physical optics and matrix optics, in order to provide a theoretical / conceptual basis in the fundamentals and the importance of ellipsometry, the which consists of an experimental technique based on the change of the polarization state of the light after being reflected by a surface, a change that when analyzed and modeled allows the optical characterization of a material of interest from the determination of the constants optics given by the refractive index, the dielectric function and the electrical conductivity.