Plasmones superficiales en sistemas multicapas Au/SiO_2
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In this work, an experimental study of the angular dependence of the reflectance of multilayer systems under conditions of total internal reflection (Kretschmann configuration) is presented. The growth of the structures is carried out in an ultra high vacuum system by electron gun evaporation and by the thermal evaporator of materials, the sensor of the latter system is calibrated by a topographic study by using the atomic force microscopy. The angular reflectometer features a high resolution automated goniometer (<1 mrad), and a 533 nm polarized TM laser that illuminates the multilayer system through a cylindrical lens. The results allow us to characterize the evolution, quality and coupling of plasmonic resonances in the function of parameters such as thickness and number of layers.